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Research Article

Table 7.

Overview of the CR-39 evaluation, etching, and analyzing procedure.

Institute Manufacturer/trade name Etching time [hours] Etching temperature [°C] NaOH conc. [N] Bulk layer [μm] Analyzed area [cm2]
DLR ATP 36/168 50 6.25 8.83/50 0.14/0.1
MTA EK TASTRAK 6/15 70 6 8.04/20.1 0.5/0.5
NPI HARZLAS TD-1 18 70 5 15.3 0.09
IFJ TASTRAK 12 70 7 20.89 0.12
NIRS HARZLAS TD-1 TechnoTrak 8 70 7 14.7 0.0404
NASA/SRAG ATP 38 60 6.25 24.29 0.03

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